AKTUELLE PARTNERANGEBOTE

Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73, Band 73)

Name: Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73, Band 73)
Brand: Kwang-Ting Cheng
SKU: 12221460

Brand : Springer, Binding : Gebundene Ausgabe, Edition : 1989, Label : Springer, Publisher : Springer, PackageQuantity : 1, medium : Gebundene Ausgabe, numberOfPages : 160, publicationDate : 1989-06-30, authors : Kwang-Ting Cheng, Agrawal, Vishwani D., ISBN : 0792390253

1 Angebote · ab 106,99 € gemeldete Gesamtkosten

Gute Entscheidungen beginnen mit einem guten Vergleich.

Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73, Band 73)