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Study of Defect States in Silicon Carbide

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Study of Defect States in Silicon Carbide

Brand : LAP Lambert Academic Publishing, Binding : Taschenbuch, Edition : Illustrated, Label : LAP LAMBERT Academic Publishing, Publisher : LAP LAMBERT Academic Publishing, Format : Illustriert, medium : Taschenbuch, numberOfPages : 200, publicationDate : 2013-08-02, releaseDate : 2013-08-02, authors : Padmaja Patnaik, Gautam Mukhopadhyay, Singh, Prabhakar P., ISBN : 3659432024

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