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Spatial Point Patterns: Methodology and Applications with R (Chapman & Hall/Crc Interdisciplinary Statistics)

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Spatial Point Patterns: Methodology and Applications with R (Chapman & Hall/Crc Interdisciplinary Statistics)

Binding : Gebundene Ausgabe, Label : Apple Academic Press Inc., Publisher : Apple Academic Press Inc., PackageQuantity : 1, medium : Gebundene Ausgabe, numberOfPages : 810, publicationDate : 2015-12-31, authors : Baddeley, Adrian (Centre for Exploration Targeting, University of Western Australia, Nedlands, Australia), Rubak, Ege (Aalborg University, Denmark), Turner, Rolf (University of Auckland, New Zealand), ISBN : 1482210207

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