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Single Event Upsets in Sub-65nm CMOS technologies: Monte-Carlo simulations and contribution to understanding of physical mechanisms

Name: Single Event Upsets in Sub-65nm CMOS technologies: Monte-Carlo simulations and contribution to understanding of physical mechanisms
Brand: Slawosz Uznanski
SKU: 6726400

Brand : LAP Lambert Academic Publishing, Binding : Taschenbuch, Label : LAP LAMBERT Academic Publishing, Publisher : LAP LAMBERT Academic Publishing, medium : Taschenbuch, numberOfPages : 192, publicationDate : 2011-12-01, authors : Slawosz Uznanski, ISBN : 3846595519

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Single Event Upsets in Sub-65nm CMOS technologies: Monte-Carlo simulations and contribution to understanding of physical mechanisms

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das wirklich zu dir passt.