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Reliability of high-k / metal gate field-effect transistors considering circuit operational constraints

Name: Reliability of high-k / metal gate field-effect transistors considering circuit operational constraints
Brand: Steve Kupke
SKU: 6023128

Brand : Books on Demand, Binding : Taschenbuch, Edition : 1, Label : BoD – Books on Demand, Publisher : BoD – Books on Demand, medium : Taschenbuch, numberOfPages : 124, publicationDate : 2016-06-06, releaseDate : 2016-06-06, authors : Steve Kupke, ISBN : 3741208698

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Reliability of high-k / metal gate field-effect transistors considering circuit operational constraints