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Reliability Characteristics of Rare-earth oxides and Gate Stacks on Ge

Name: Reliability Characteristics of Rare-earth oxides and Gate Stacks on Ge
Brand: Rahman, M. Shahinur
SKU: 5961533

Brand : LAP Lambert Academic Publishing, Binding : Taschenbuch, Label : LAP LAMBERT Academic Publishing, Publisher : LAP LAMBERT Academic Publishing, medium : Taschenbuch, numberOfPages : 228, publicationDate : 2013-11-29, releaseDate : 2013-11-29, authors : Rahman, M. Shahinur, ISBN : 3659451835

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Reliability Characteristics of Rare-earth oxides and Gate Stacks on Ge