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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Binding : Gebundene Ausgabe, Label : IntechOpen, Publisher : IntechOpen, medium : Gebundene Ausgabe, numberOfPages : 274, publicationDate : 2022-01-07, releaseDate : 2022-01-07, publishers : Pathak, Chandra Shakher, Samir Kumar, ISBN : 1839682299

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