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Perspectives on Plagiarism and Intellectual Property in a Postmodern World

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Perspectives on Plagiarism and Intellectual Property in a Postmodern World

Brand : State University of New York Press, Binding : Taschenbuch, Edition : Illustrated, Label : State University of New York Press, Publisher : State University of New York Press, NumberOfItems : 1, PackageQuantity : 1, Format : Illustriert, medium : Taschenbuch, numberOfPages : 328, publicationDate : 1999-06-01, publishers : Lise Buranen, Roy, Alice M, ISBN : 079144080X

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