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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, Band 270)

Name: Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, Band 270)
Brand: Cor Claeys
SKU: 3589608

Binding : Gebundene Ausgabe, Edition : 1st ed. 2018, Label : Springer, Publisher : Springer, medium : Gebundene Ausgabe, numberOfPages : 438, publicationDate : 2018-08-22, authors : Cor Claeys, Eddy Simoen, ISBN : 3319939246

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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, Band 270)