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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics, Band 10)

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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics, Band 10)

Brand : Springer-Verlag GmbH, Binding : Gebundene Ausgabe, Edition : 3rd ed. 2018, Label : Springer, Publisher : Springer, medium : Gebundene Ausgabe, numberOfPages : 321, publicationDate : 2019-01-22, authors : Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert, ISBN : 3319998242

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