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Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach (Microsystems)

Binding : Taschenbuch, Edition : 2012, Label : Springer, Publisher : Springer, medium : Taschenbuch, numberOfPages : 218, publicationDate : 2014-02-22, authors : Tomi Laurila, Vesa Vuorinen, Mervi Paulasto-Kröckel, Markus Turunen, Mattila, Toni T., Jorma Kivilahti, ISBN : 1447160681

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