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High-Resolution X-Ray Scattering: From Thin Films To Lateral Nanostructures (Advanced Texts In Physics)

Brand : Springer, Binding : Taschenbuch, Edition : 2nd ed. 2004. Softcover reprint of the original 2nd ed. 2004, Label : Springer, Publisher : Springer, PackageQuantity : 1, medium : Taschenbuch, numberOfPages : 428, publicationDate : 2011-12-12, releaseDate : 2011-12-12, authors : Ullrich Pietsch, ISBN : 1441923071

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