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High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology

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High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology

Brand : Springer, Binding : Gebundene Ausgabe, Edition : 2003, Label : Springer, Publisher : Springer, PackageQuantity : 1, Format : Illustriert, medium : Gebundene Ausgabe, numberOfPages : 315, publicationDate : 2002-10-31, authors : Jon Orloff, Lynwood Swanson, Mark Utlaut, ISBN : 030647350X

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