AKTUELLE PARTNERANGEBOTE

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing) (Frontiers in Electronic Testing, 5, Band 5)

Name: From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing) (Frontiers in Electronic Testing, 5, Band 5)
Brand: Khare, Jitendra B.
SKU: 7031563

Brand : Springer, Binding : Taschenbuch, Edition : Softcover reprint of the original 1st ed. 1996, Label : Springer, Publisher : Springer, medium : Taschenbuch, numberOfPages : 172, publicationDate : 2012-07-31, releaseDate : 2012-07-31, authors : Khare, Jitendra B., publishers : H. Jxf6rnvall, ISBN : 146128595X

1 Angebote · ab 102,84 € gemeldete Gesamtkosten

Gute Entscheidungen beginnen mit einem guten Vergleich.

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing) (Frontiers in Electronic Testing, 5, Band 5)