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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)

Name: From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)
Brand: Khare, Jitendra B.
SKU: 12221764

Binding : Gebundene Ausgabe, Edition : 1996, Label : Springer, Publisher : Springer, NumberOfItems : 1, PackageQuantity : 1, medium : Gebundene Ausgabe, numberOfPages : 150, publicationDate : 1996-04-30, authors : Khare, Jitendra B., Wojciech Maly, languages : english, ISBN : 0792397142

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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)