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Fault-Tracing: Against Quine-Duhem: A Defense of the Objectivity of Scientific Justification (Epistemic Studies, 40)

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Fault-Tracing: Against Quine-Duhem: A Defense of the Objectivity of Scientific Justification (Epistemic Studies, 40)

Binding : Taschenbuch, Edition : 1, Label : De Gruyter, Publisher : De Gruyter, medium : Taschenbuch, numberOfPages : 232, publicationDate : 2022-07-18, authors : Sam Mitchell, ISBN : 3110996782

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