AKTUELLE PARTNERANGEBOTE

Experimental Techniques for Low Temperature Measurements: Cryostat Design, Materials, and Critical-Current Testing: Cryostat Design, Material Properties and Superconductor Critical-current Testing

Name: Experimental Techniques for Low Temperature Measurements: Cryostat Design, Materials, and Critical-Current Testing: Cryostat Design, Material Properties and Superconductor Critical-current Testing
Brand: Jack Ekin
SKU: 8103617

Binding : Gebundene Ausgabe, Label : Oxford University Press, Publisher : Oxford University Press, medium : Gebundene Ausgabe, numberOfPages : 560, publicationDate : 2006-12-07, authors : Jack Ekin, languages : english, ISBN : 0198570546

1 Angebote · ab 189,10 € gemeldete Gesamtkosten

Gute Entscheidungen beginnen mit einem guten Vergleich.

Experimental Techniques for Low Temperature Measurements: Cryostat Design, Materials, and Critical-Current Testing: Cryostat Design, Material Properties and Superconductor Critical-current Testing