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Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems)

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Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems)

Binding : Gebundene Ausgabe, Edition : 2007, Label : Springer, Publisher : Springer, PackageQuantity : 3, medium : Gebundene Ausgabe, numberOfPages : 255, publicationDate : 2007-07-26, releaseDate : 2006-12-15, authors : Charles Chiang, Jamil Kawa, ISBN : 1402051875

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