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Defects Spectroscopy in Silicon Diodes: Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage

Name: Defects Spectroscopy in Silicon Diodes: Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage
Brand: Nicolò Barbero
SKU: 9764614

Brand : Edizioni Accademiche Italiane, Binding : Taschenbuch, Label : Edizioni Accademiche Italiane, Publisher : Edizioni Accademiche Italiane, medium : Taschenbuch, numberOfPages : 244, publicationDate : 2015-11-03, releaseDate : 2015-11-03, authors : Nicolò Barbero, ISBN : 3639773047

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Defects Spectroscopy in Silicon Diodes: Deep-level traps in semiconductors physics: from ultra-fast recovery to radiation-induced damage