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Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (NATO Science Series II: Mathematics, Physics and Chemistry, 220, Band 220)

Name: Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (NATO Science Series II: Mathematics, Physics and Chemistry, 220, Band 220)
Brand: Evgeni Gusev
SKU: 722690

Brand : Springer, Binding : Taschenbuch, Edition : 2006, Label : Springer, Publisher : Springer, PackageQuantity : 1, medium : Taschenbuch, numberOfPages : 508, publicationDate : 2008-05-27, releaseDate : 2008-05-27, authors : Evgeni Gusev, ISBN : 140204366X

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Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (NATO Science Series II: Mathematics, Physics and Chemistry, 220, Band 220)