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Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (NATO Science Series II: Mathematics, Physics and Chemistry, 220, Band 216)

Name: Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (NATO Science Series II: Mathematics, Physics and Chemistry, 220, Band 216)
Brand: Evgeni Gusev
SKU: 722689

Brand : Springer, Binding : Gebundene Ausgabe, Edition : 2006, Label : Springer, Publisher : Springer, NumberOfItems : 1, Format : Illustriert, medium : Gebundene Ausgabe, numberOfPages : 503, publicationDate : 2006-01-27, publishers : Evgeni Gusev, ISBN : 1402043651

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Defects in HIgh-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices (NATO Science Series II: Mathematics, Physics and Chemistry, 220, Band 216)