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Defect Reduction Study of MBE Grown CdTe Thin Films by Annealing: Decreasing of Defects of MBE Grown CdTe Fılms by Ex-Situ Annealing as a Buffer Layer ... Buffer Layer for MCT IR Detector Applications

Name: Defect Reduction Study of MBE Grown CdTe Thin Films by Annealing: Decreasing of Defects of MBE Grown CdTe Fılms by Ex-Situ Annealing as a Buffer Layer ... Buffer Layer for MCT IR Detector Applications
Brand: Emine Bakali
SKU: 9431750

Brand : VDM Verlag, Binding : Taschenbuch, Label : Türkiye Alim Kitapları, Publisher : Türkiye Alim Kitapları, medium : Taschenbuch, numberOfPages : 112, publicationDate : 2016-09-28, releaseDate : 2016-09-28, authors : Emine Bakali, ISBN : 3639814568

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Defect Reduction Study of MBE Grown CdTe Thin Films by Annealing: Decreasing of Defects of MBE Grown CdTe Fılms by Ex-Situ Annealing as a Buffer Layer ... Buffer Layer for MCT IR Detector Applications