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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, Band 34)

Name: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, Band 34)
Brand: Manoj Sachdev
SKU: 3581944

Brand : Springer, Binding : Taschenbuch, Edition : Softcover reprint of hardcover 2nd ed. 2007, Label : Springer, Publisher : Springer, medium : Taschenbuch, numberOfPages : 352, publicationDate : 2010-11-10, releaseDate : 2010-11-10, authors : Manoj Sachdev, ISBN : 1441942858

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, Band 34)

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