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Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion (Engineering Materials and Processes)

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Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion (Engineering Materials and Processes)

Brand : Springer, Binding : Gebundene Ausgabe, Edition : 2009, Label : Springer, Publisher : Springer, NumberOfItems : 1, PackageQuantity : 1, medium : Gebundene Ausgabe, numberOfPages : 312, publicationDate : 2008-12-01, releaseDate : 2008-12-01, authors : Seebauer, ISBN : 1848820585

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