AKTUELLE PARTNERANGEBOTE

Characterization of Crystal Growth Defects by X-Ray Methods (Nato Science Series B:, 63, Band 63)

Brand : Springer, Binding : Taschenbuch, Edition : 1980, Label : Springer, Publisher : Springer, medium : Taschenbuch, numberOfPages : 615, publicationDate : 2012-12-16, authors : B.K. Tanner, ISBN : 147571128X

1 Angebote · ab 53,49 € gemeldete Gesamtkosten