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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics)

Name: An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics)
Brand: Sarah Fearn
SKU: 5592540

Brand : Iop Concise Physics, Binding : Taschenbuch, Label : Morgan & Claypool Publishers, Publisher : Morgan & Claypool Publishers, medium : Taschenbuch, numberOfPages : 68, publicationDate : 2015-10-16, releaseDate : 2015-10-16, authors : Sarah Fearn, ISBN : 1681740249

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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics)