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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Name: Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Brand: Alberto Bosio
SKU: 4961784

Brand : Springer, Binding : Taschenbuch, Edition : 2010, Label : Springer, Publisher : Springer, medium : Taschenbuch, numberOfPages : 188, publicationDate : 2014-09-03, releaseDate : 2014-09-03, authors : Alberto Bosio, ISBN : 1489983147

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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

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